This document describes methods for the determination of mineralogical phases typically apparent in nitride and oxy-nitride bonded silicon carbide refractory products using a Bragg-Brentano diffractometer.

It includes details of sample preparations and general principles for qualitative and quantitative analyses of mineralogical phase composition. Quantitative determination of α-Si₃N₄, β-Si₃N₄, Si₂ON₂, AlN, and β’- SiAlON are described.

For quantitative determination of α-Si₃N₄, β-Si₃N₄, Si₂ON₂, AlN and β’-SiAlON refinement procedures based on the total nitrogen content of the sample are described.