1 Scope
This Technical Report describes a X-ray fluorescence (XRF) spectrometric method for
the determination of Si and Al contents in ferro-silicon materials.
The method is applicable to:
The correction of the spectrometric measurement from spectral interferences on the
analytical lines used is essential. This Technical Report is valid for the analytical
lines:
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— Si Kα 7.126 (for element contents between 45 % and 90 %);
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— Al Kα 8.339 (for element contents between 0,8 % and 6 %);
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— Fe Kα 1.937 (for element contents between 10 % and 58 %).
NOTE For matrix matching purposes, iron is included in the analytical program to be prepared.
Within the conditions here above, spectral interferences don’t need to be calculated.