PD CEN/TR 10353 is an international standard that discusses the chemical analysis of ferrous materials. The ICP-OES principle measures the amount of emitted light at each wavelength and uses this information to calculate the concentration of lead in the sample.
PD CEN/TR 10353 describes an inductively coupled plasma optical emission spectrometric method for the determination of Al, Ti and P contents in ferro-silicon materials. The method applies to:
PD CEN/TR 10353 on chemical analysis of ferrous materials applies to:
The ICP-OES principle measures the amount of emitted light at each wavelength and uses this information to calculate the concentration of lead in the sample. To calibrate an ICP-OES, solutions containing known amounts of each element are measured.
PD CEN/TR 10353 provides guidance for the optical emission spectrometer, equipped with inductively coupled plasma in which the spectrometer can be either of simultaneous or sequential type. A sequential spectrometer is equipped with an extra arrangement for simultaneous measurement of the internal reference element emitted light. In this case, the sequential spectrometer is used for the measurement method using the internal reference element.
CEN/TR 10353:2011