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23/30456515 DC | 9 Oct 2023 | BSI Knowledge
Standard
23/30456515 DC
BS ISO 5618-2. Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for GaN crystal surface defects - Part 2. Method of determining the etch pit density
Current
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Published:
9 Oct 2023
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Product Details
Descriptors
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ICS Codes
81.060.30 Advanced ceramics
Committee
RPI/13
International relationships
Identical to:
ISO 5618-2
ISBN
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Publisher
BSI