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24/30479937 DC | 7 Jun 2024 | BSI Knowledge
Standard
24/30479937 DC
BS ISO 25498 Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope
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•
Published:
7 Jun 2024
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Product Details
Descriptors
Chemical analysis and testing
Electron diffraction
Spectroscopy
Test specimens
Microanalysis
Crystal lattices
Electron microscopes
Electron beams
Optical instruments
ICS Codes
71.040.50 Physicochemical methods of analysis
Committee
CII/9
International relationships
Identical to:
ISO 25498
ISBN
—
Publisher
BSI