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25/30505052 DC | 18 Jul 2025 | BSI Knowledge
Standard
25/30505052 DC
BS ISO 25387 Microbeam analysis — Analytical electron microscopy — Procedures for determining the point resolution of high-resolution transmission electron microscope
Current
•
Published:
18 Jul 2025
Overview
Preview
References
History
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Product Details
Descriptors
Laser beams
Analysis
Electrons
Microscopes
Resolution
Electron microscopes
ICS Codes
37.020 Optical equipment
Committee
CII/9
International relationships
Identical to:
ISO 25387
ISBN
—
Publisher
BSI