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24/30479444 DC | 5 Feb 2024 | BSI Knowledge
Standard
24/30479444 DC
BS ISO 20263 Microbeam analysis. Analytical electron microscopy. Method for the determination of interface position in the cross-sectional image of the layered materials
Current
•
Published:
5 Feb 2024
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Product Details
Descriptors
Electron microscopes
Materials by form
Analysis
Interfaces
Measurement
ICS Codes
37.020 Optical equipment
71.040.50 Physicochemical methods of analysis
Committee
CII/9
International relationships
Identical to:
ISO 20263
ISBN
—
Publisher
BSI