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18/30319114 DC | 8 Jun 2018 | BSI Knowledge
Standard
18/30319114 DC
BS ISO 20171. Microbeam analysis. Scanning electron microscopy. Tagged image file format for Scanning electron microscopy(TIFF/SEM)
Current
•
Published:
8 Jun 2018
Overview
Preview
References
History
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Product Details
Descriptors
Electron beams
Magnification
Microscopes
Control samples
Electron optics
Calibration
Optical phenomena
Accuracy
Electron microscopes
Scanning electron microscopes
Optical instruments
ICS Codes
35.240.70 IT applications in science
37.020 Optical equipment
Committee
CII/9
International relationships
Identical to:
ISO 20171
ISO/DIS 20171
ISBN
—
Publisher
BSI