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26/30493764 DC | 2 Mar 2026 | BSI Knowledge
Standard
26/30493764 DC
BS ISO 16887 Microbeam analysis. Analytical electron microscopy. Guidelines for transmission electron microscopy specimen preparation by lift-out method using focused ion beam system
Current
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Published:
2 Mar 2026
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Product Details
Descriptors
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ICS Codes
71.040.50 Physicochemical methods of analysis
Committee
CII/9
International relationships
Identical to:
ISO 16887
ISBN
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Publisher
BSI