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21/30440164 DC | 14 Mar 2022 | BSI Knowledge
Standard
21/30440164 DC
BS ISO 14606. Surface chemical analysis. Sputter depth profiling. Optimization using layered systems as reference materials
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Published:
14 Mar 2022
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Product Details
Descriptors
Chemical analysis and testing
Depth
Spectroscopy
X-rays
Photoelectron spectroscopy
X-ray photoelectron spectroscopy
ICS Codes
71.040.40 Chemical analysis
Committee
CII/60
International relationships
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ISBN
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Publisher
BSI