Search BSI Knowledge
Cookie Settings
24/30499009 DC | 16 Aug 2024 | BSI Knowledge
Standard
24/30499009 DC
BS IEC 63581-1 Semiconductor devices - The recognition criteria of defects in polished indium phosphide wafers - Part 1: Classification of defects
Current
•
Published:
16 Aug 2024
Overview
Preview
References
History
Visit the preview section for more information
Product Details
Descriptors
—
ICS Codes
31.080.01 Semiconductor devices in general
31.080.99 Other semiconductor devices
Committee
EPL/47
International relationships
—
ISBN
—
Publisher
BSI