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20/30406234 DC | 26 Feb 2021 | BSI Knowledge
Standard
20/30406234 DC
BS IEC 63275-2 Ed.1.0. Semiconductor devices. Reliability test method for silicon carbide discrete metal-oxide semiconductor field effect transistors - Part 2. Test method for bipolar degradation by body diode operating
Current
•
Published:
26 Feb 2021
Overview
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References
History
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Product Details
Descriptors
Electronic equipment and components
Semiconductor devices
Semiconductors
Metal oxide semiconductors
Testing methods
ICS Codes
31.080.01 Semiconductor devices in general
31.080.30 Transistors
31.080.99 Other semiconductor devices
Committee
EPL/47
International relationships
Identical to:
47/2623/CD
prEN IEC 63275-2:2021
ISBN
—
Publisher
BSI