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20/30406230 DC | 26 Feb 2021 | BSI Knowledge
Standard
20/30406230 DC
BS IEC 63275-1. Semiconductor devices. Reliability test method for silicon carbide discrete metal-oxide semiconductor field effect transistors - Part 1. Test method for bias temperature instability
Current
•
Published:
26 Feb 2021
Overview
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References
History
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Product Details
Descriptors
Semiconductor technology
Semiconductor devices
Semiconductors
Diode transistor logic circuits
Transistor transistor logic circuits
ICS Codes
31.080 Semiconductor devices
31.080.01 Semiconductor devices in general
31.080.30 Transistors
Committee
EPL/47
International relationships
Identical to:
47/2622/CD
prEN IEC 63275-1:2021
ISBN
—
Publisher
BSI