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17/30366375 DC | 27 Nov 2017 | BSI Knowledge
Standard
17/30366375 DC
BS IEC 62373-1. Semiconductor devices. Bias-temperature stability test for metal-oxide semiconductor field-effect transistors (MOSFET) - Part 1. Fast BTI Test method
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Published:
27 Nov 2017
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Product Details
Descriptors
Transistors
Metal oxide semiconductors
Electronic equipment and components
Temperature
Semiconductors
Voltage measurement
Semiconductor devices
Testing conditions
ICS Codes
31.080.30 Transistors
Committee
EPL/47
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ISBN
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Publisher
BSI