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22/30437195 DC | 11 Feb 2022 | BSI Knowledge
Standard
22/30437195 DC
BS IEC 62047-43. Semiconductor devices. Micro-electromechanical devices - Part 43. Test method of electrical characteristics after cyclic bending deformation for flexible electro-mechanical devices
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Published:
11 Feb 2022
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Product Details
Descriptors
Semiconductor manufacture
Semiconductor technology
Electromechanical storage
Bend testing
Testing methods
Characteristics
Performance characteristics
ICS Codes
31.080.99 Other semiconductor devices
Committee
EPL/47
International relationships
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ISBN
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Publisher
BSI