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20/30410215 DC | 6 Mar 2020 | BSI Knowledge
Standard
Withdrawn
20/30410215 DC
BS EN IEC 63287-1. Semiconductor devices. Generic semiconductor qualification guidelines - Part 1. Guidelines for LSI reliability qualification
Published:
6 Mar 2020
•
Withdrawn:
30 Nov 2021
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Product Details
Descriptors
Semiconductor devices
Reliability
Electrical failure
Tests
Test methods
ICS Codes
31.080.01 Semiconductor devices in general
Committee
EPL/47
International relationships
Identical to:
IEC 63287-1 Ed.1.0
prEN IEC 63287-1:2020
ISBN
—
Publisher
BSI