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19/30404655 DC | 17 Oct 2019 | BSI Knowledge
Standard
19/30404655 DC
BS EN IEC 63229. Semiconductor devices. The classification of defects in gallium nitride epitaxial film on silicon carbide substrate
Current
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Published:
17 Oct 2019
Overview
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References
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Product Details
Descriptors
Substrates (insulating)
Electrical equipment
Computer hardware
Components
Electrical components
Computer components
Common terms
Electronic equipment and components
Semiconductor technology
ICS Codes
31.080.01 Semiconductor devices in general
31.080.99 Other semiconductor devices
Committee
EPL/47
International relationships
Identical to:
47/2599/CD
ISBN
—
Publisher
BSI