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20/30423207 DC | 11 Sep 2020 | BSI Knowledge
Standard
20/30423207 DC
BS EN IEC 62951-9. Semiconductor devices. Flexible and stretchable semiconductor devices - Part 9. Performance testing methods of one transistor and one resistor (1T1R) resistive memory cells
Current
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Published:
11 Sep 2020
Overview
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References
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Product Details
Descriptors
Semiconductor devices
Performance testing
Testing methods
Transistors
Resistors
ICS Codes
31.080.01 Semiconductor devices in general
31.080.99 Other semiconductor devices
Committee
EPL/47
International relationships
Identical to:
47/2656/CD
ISBN
—
Publisher
BSI