Search BSI Knowledge
Cookie Settings
24/30500239 DC | 13 Sep 2024 | BSI Knowledge
Standard
24/30500239 DC
BS EN IEC 62047-52 Semiconductor devices. Micro-electromechanical devices - Part 52. Biaxial tensile testing method for stretchable MEMS
Current
•
Published:
13 Sep 2024
Overview
Preview
References
History
Visit the preview section for more information
Product Details
Descriptors
Semiconductor manufacture
Semiconductor materials
Semiconductor technology
Electronic equipment and components
Semiconductor devices
Tensile testing equipment
Tensile testing
ICS Codes
31.080.99 Other semiconductor devices
Committee
EPL/47
International relationships
—
ISBN
—
Publisher
BSI