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24/30505492 DC | 22 Nov 2024 | BSI Knowledge
Standard
24/30505492 DC
BS EN IEC 62047-51 Semiconductor Devices - Micro-electromechanical Devices - Part 51: Test method of electrical characteristics under two-directional cyclic bending deformation for flexible microelectromechanical devices
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Published:
22 Nov 2024
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Product Details
Descriptors
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ICS Codes
31.080.99 Other semiconductor devices
Committee
EPL/47
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ISBN
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Publisher
BSI