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20/30405217 DC | 5 Jun 2020 | BSI Knowledge
Standard
Withdrawn
20/30405217 DC
BS EN IEC 62047-40. Semiconductor devices. Micro-electromechanical devices - Part 40. Test methods of Micro-electromechanical inertial shock switch threshold
Published:
5 Jun 2020
•
Withdrawn:
14 Sep 2021
Overview
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Product Details
Descriptors
Electronic equipment and components
Integrated circuits
Semiconductor devices
Semiconductor technology
Electromechanical devices
Test methods
ICS Codes
31.080.99 Other semiconductor devices
Committee
EPL/47
International relationships
Identical to:
47F/360/CD
IEC 62047-40 Ed.1.0
ISBN
—
Publisher
BSI