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24/30497538 DC | 6 Sep 2024 | BSI Knowledge
Standard
24/30497538 DC
BS EN IEC 60749-7 Semiconductor devices. Mechanical and climatic test methods - Part 7. Internal moisture content measurement and the analysis of other residual gases
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Published:
6 Sep 2024
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Product Details
Descriptors
Water vapour
Mechanical testing
Climate
Moisture measurement
Integrated circuits
Semiconductor devices
Environmental testing
Water-vapour tests
Electronic equipment and components
Gas analysis
ICS Codes
31.080.01 Semiconductor devices in general
Committee
EPL/47
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ISBN
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Publisher
BSI