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20/30425836 DC | 23 Oct 2020 | BSI Knowledge
Standard
20/30425836 DC
BS EN IEC 60749-37. Semiconductor devices. Mechanical and climatic test methods - Part 37. Board level drop test method using an accelerometer
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Published:
23 Oct 2020
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Product Details
Descriptors
Printed-circuit boards
Electronic equipment and components
Integrated circuits
Surface mounting devices
Accelerated testing
Environmental testing
Drop tests
Semiconductor devices
Mechanical testing
Impact testing
ICS Codes
31.080.01 Semiconductor devices in general
Committee
EPL/47
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ISBN
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Publisher
BSI