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26/30551649 DC | 30 Jan 2026 | BSI Knowledge
Standard
26/30551649 DC
BS EN IEC 60749-29 Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test
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Published:
30 Jan 2026
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Product Details
Descriptors
Climate
Electrical testing
Overvoltage
Destructive testing
Failure rate
Environmental testing
Overvoltage tests
Mechanical testing
Electronic equipment and components
Integrated circuits
Semiconductor devices
Electrical faults
Electrical impedance
ICS Codes
31.080.01 Semiconductor devices in general
Committee
EPL/47
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ISBN
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Publisher
BSI