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21/30434332 DC | 2 Apr 2021 | BSI Knowledge
Standard
21/30434332 DC
BS EN 63373. Dynamic on-resistance test method guidelines for GaN HEMT based power conversion devices
Current
•
Published:
2 Apr 2021
Overview
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References
History
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Product Details
Descriptors
Test methods
Electronic equipment and components
Semiconductor devices
Transistors
Power transistors
ICS Codes
31.080.01 Semiconductor devices in general
31.080.99 Other semiconductor devices
Committee
EPL/47
International relationships
Identical to:
IEC 63373 Ed.1.0
prEN IEC 63373:2021
ISBN
—
Publisher
BSI