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18/30386543 DC | 1 May 2020 | BSI Knowledge
Standard
18/30386543 DC
BS EN 63229 Ed.1.0. Semiconductor devices. The classification of defects in gallium nitride epitaxial wafers on silicon carbide substrate
Current
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Published:
1 May 2020
Overview
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Product Details
Descriptors
Substrates (insulating)
Electrical equipment
Computer hardware
Components
Electrical components
Computer components
Common terms
Electronic equipment and components
Semiconductor technology
ICS Codes
31.080 Semiconductor devices
31.080.01 Semiconductor devices in general
31.080.99 Other semiconductor devices
Committee
EPL/47
International relationships
Identical to:
IEC 63229 Ed.1.0
ISBN
—
Publisher
BSI