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18/30381548 DC | 3 Aug 2018 | BSI Knowledge
Standard
18/30381548 DC
BS EN 62373-1. Semiconductor devices. Bias-temperature stability test for metal-oxide semiconductor field-effect transistors (MOSFET) - Part 1. Fast BTI Test method
Current
•
Published:
3 Aug 2018
Overview
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References
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Product Details
Descriptors
Testing conditions
Semiconductors
Voltage measurement
Electronic equipment and components
Temperature
Transistors
Metal oxide semiconductors
Semiconductor devices
ICS Codes
31.080.30 Transistors
Committee
EPL/47
International relationships
Identical to:
IEC 62373-1 Ed.1.0
ISBN
—
Publisher
BSI