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20/30419235 DC | 21 Nov 2020 | BSI Knowledge
Standard
20/30419235 DC
BS EN 60749-28. Semiconductor devices. Mechanical and climatic test methods - Part 28. Electrostatic discharge (ESD) sensitivity testing. Charged device model (CDM). Device level
Current
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Published:
21 Nov 2020
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Product Details
Descriptors
Electrostatics
Electric charge
Electronic equipment and components
Electric discharges
Mechanical testing
Semiconductor devices
Test methods
Environmental testing
Integrated circuits
ICS Codes
31.080.01 Semiconductor devices in general
Committee
EPL/47
International relationships
Identical to:
IEC 60749-28 Ed.2.0
ISBN
—
Publisher
BSI