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21/30435579 DC | 14 May 2021 | BSI Knowledge
Standard
21/30435579 DC
BS EN 60749-10. Semiconductor devices. Mechanical and climatic test methods - Part 10. Mechanical shock. Device and subassembly
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Published:
14 May 2021
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Product Details
Descriptors
Integrated circuits
Destructive testing
Electronic equipment and components
Mechanical shock
Environmental testing
Climate
Mechanical testing
Impact testing
Semiconductor devices
Semiconductor storage
Testing methods
Test methods
ICS Codes
31.080.01 Semiconductor devices in general
Committee
EPL/47
International relationships
Identical to:
IEC 60749-10 Ed.2.0
ISBN
—
Publisher
BSI