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Standard
BS EN IEC 60749-10:2022
Semiconductor devices. Mechanical and climatic test methods - Mechanical shock. device and subassembly
Current
•
Published:
31 Aug 2022
Overview
Preview
References
History
Product Details
Descriptors
Integrated circuits
Destructive testing
Electronic equipment and components
Mechanical shock
Environmental testing
Climate
Mechanical testing
Impact testing
Semiconductor devices
ICS Codes
31.080.01 Semiconductor devices in general
Committee
EPL/47
International relationships
Identical to:
EN 60749-10 Ed.2.0
IEC 60749-10 Ed.2.0
ISBN
978 0 539 17345 1
Publisher
BSI