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IEC 60749-27:2003

Semiconductor devices. Mechanical and climatic test methods - Electostatic discharge (ESD) sensivity testing. Machine model (MM)

Published:

1 Oct 2003

•

Withdrawn:

Date not available

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Product Details
Descriptors
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ICS Codes
31.080.01 Semiconductor devices in general
Committee
EPL/47
International relationships
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ISBN
2 8318 7220 0
Publisher
IEC