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Standard

BS EN IEC 60749-37:2022

Semiconductor devices. Mechanical and climatic test methods - Board level drop test method using an accelerometer

Current

•

Published:

30 Nov 2022

Overview
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References
History
Product Details
Descriptors
Semiconductor devices
Semiconductors
Electronic components
Printed-circuit boards
Electrical failure
Failure analysis
Testing
Reports
Accelerometers
ICS Codes
31.080.01 Semiconductor devices in general
Committee
EPL/47
International relationships
Identical to:

EN 60749-37 Ed.2.0

IEC 60749-37 Ed.2.0

ISBN
978 0 539 15199 2
Publisher
BSI