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Standard
Withdrawn

BS IEC 60747-9:2007

Semiconductor devices. Discrete devices - Insulated-gate bipolar transistors (IGBTs)

Published:

30 Nov 2007

•

Withdrawn:

22 Nov 2019

Overview
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Product Details
Descriptors
Electronic equipment and components
Rated power
Rated voltage
Rated current
Electric current
Bipolar transistors
Symbols
Current measurement
Integrated circuits
Electrical safety
Transistors
Response time
Thermal resistance
Ratings
Circuits
Voltage measurement
Dissipation factor
Electrical resistance
Voltage
Capacitance
Graphic symbols
Semiconductor devices
Temperature
Time
Electrical measurement
Leakage currents
Electrical insulation
Electrical properties and phenomena
Testing conditions
ICS Codes
31.080.01 Semiconductor devices in general
31.080.30 Transistors
Committee
EPL/47
International relationships
Identical to:

IEC 60747-9:2007

ISBN
978 0 580 54381 4
Publisher
BSI