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BS ISO 22493:2014

Microbeam analysis. Scanning electron microscopy. Vocabulary

Current, Under Review

•

Published:

30 Apr 2014

Overview
Preview
References
History
Product Details
Descriptors
Electron optics
Terminology
Electron beams
Electron microscopes
Microscopes
Vocabulary
Optical instruments
Instrumental methods of analysis
Scanning electron microscopes
ICS Codes
01.040.37 Image technology (Vocabularies)
01.040.71 Chemical technology (Vocabularies)
37.020 Optical equipment
71.040.50 Physicochemical methods of analysis
Committee
CII/9
International relationships
Identical to:

ISO 22493:2014

ISBN
978 0 580 84447 8
Publisher
BSI