Standard

BS IEC 63601:2026

Guideline for evaluating bias temperature instability of silicon carbide metal-oxide-semiconductor devices for power electronic conversion

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Product Details

Descriptors

Temperature

Evaluation

Bias

Silicon carbide

Electronic equipment and components

Semiconductors

Metal oxide semiconductors

ICS Codes

31.080.30 Transistors

31.080.99 Other semiconductor devices

Committee

EPL/47

International relationships

Identical to:

IEC 63601:2026

ISBN

978 0 539 33085 4

Publisher

BSI