© British Standards Institution 2026
Site Map
Standard

24/30497546 DC

BS EN IEC 60749-24 Semiconductor devices. Mechanical and climatic test methods - Part 24. Accelerated moisture resistance. Unbiased HAST

Current

•

Published:

6 Sep 2024

Overview
Preview
References
History
Visit the preview section for more information
Product Details
Descriptors
Solid-state physics
Accelerated testing
Mechanical testing
Semiconductor devices
Accelerated corrosion tests
Moisture measurement
Climate
Temperature
Humidity
Performance testing
Corrosion resistance
Destructive testing
Electronic equipment and components
Damp-heat tests
Reliability
Environmental testing
Integrated circuits
Testing conditions
ICS Codes
31.080.01 Semiconductor devices in general
Committee
EPL/47
International relationships
—
ISBN
—
Publisher
BSI